Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing

Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing

10.1109/55.720187

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Bibliographic Details
Main Authors: Chim, W.K., Yeo, B.P., Lim, P.S., Chan, D.S.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80690
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Institution: National University of Singapore
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