Microcracks of the thin-film head alumina: "l" cracks and "u" cracks

10.1109/20.538807

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Main Authors: Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80719
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-807192023-10-30T07:24:42Z Microcracks of the thin-film head alumina: "l" cracks and "u" cracks Chekanov, A.S. Low, T.S. Alli, S. Kolosov, O. Briggs, A. ELECTRICAL ENGINEERING DATA STORAGE INSTITUTE 10.1109/20.538807 IEEE Transactions on Magnetics 32 5 PART 1 3696-3698 IEMGA 2014-10-07T03:00:34Z 2014-10-07T03:00:34Z 1996 Article Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A. (1996). Microcracks of the thin-film head alumina: "l" cracks and "u" cracks. IEEE Transactions on Magnetics 32 (5 PART 1) : 3696-3698. ScholarBank@NUS Repository. https://doi.org/10.1109/20.538807 00189464 http://scholarbank.nus.edu.sg/handle/10635/80719 A1996VM25800108 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/20.538807
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Chekanov, A.S.
Low, T.S.
Alli, S.
Kolosov, O.
Briggs, A.
format Article
author Chekanov, A.S.
Low, T.S.
Alli, S.
Kolosov, O.
Briggs, A.
spellingShingle Chekanov, A.S.
Low, T.S.
Alli, S.
Kolosov, O.
Briggs, A.
Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
author_sort Chekanov, A.S.
title Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
title_short Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
title_full Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
title_fullStr Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
title_full_unstemmed Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
title_sort microcracks of the thin-film head alumina: "l" cracks and "u" cracks
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80719
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