Microcracks of the thin-film head alumina: "l" cracks and "u" cracks

10.1109/20.538807

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Bibliographic Details
Main Authors:	Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80719
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Institution:	National University of Singapore

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