Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
10.1109/20.538807
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Main Authors: | Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80719 |
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Institution: | National University of Singapore |
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