Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

Solid-State Electronics

Saved in:

Bibliographic Details
Main Authors:	Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81185
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-81185
record_format	dspace
spelling	sg-nus-scholar.10635-811852015-04-06T03:21:00Z Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model Kolachina, S. Phang, J.C.H. Chan, D.S.H. ELECTRICAL ENGINEERING Solid-State Electronics 42 6 957-962 SSELA 2014-10-07T03:05:34Z 2014-10-07T03:05:34Z 1998-06 Article Kolachina, S.,Phang, J.C.H.,Chan, D.S.H. (1998-06). Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model. Solid-State Electronics 42 (6) : 957-962. ScholarBank@NUS Repository. 00381101 http://scholarbank.nus.edu.sg/handle/10635/81185 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Solid-State Electronics
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Kolachina, S. Phang, J.C.H. Chan, D.S.H.
format	Article
author	Kolachina, S. Phang, J.C.H. Chan, D.S.H.
spellingShingle	Kolachina, S. Phang, J.C.H. Chan, D.S.H. Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
author_sort	Kolachina, S.
title	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
title_short	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
title_full	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
title_fullStr	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
title_full_unstemmed	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model
title_sort	single contact electron beam induced currents (scebic) in semiconductor junctions. part i: quantitative verification of scebic model
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81185
_version_	1681089025177288704

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

Similar Items