Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

Solid-State Electronics

Saved in:
Bibliographic Details
Main Authors: Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81185
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items