The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors
10.1088/0268-1242/12/3/003
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2014
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sg-nus-scholar.10635-812502023-10-29T23:17:14Z The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors Ling, C.H. Ang, D.S. Ooi, J.A. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME 10.1088/0268-1242/12/3/003 Semiconductor Science and Technology 12 3 245-251 SSTEE 2014-10-07T03:06:18Z 2014-10-07T03:06:18Z 1997-03 Article Ling, C.H., Ang, D.S., Ooi, J.A. (1997-03). The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors. Semiconductor Science and Technology 12 (3) : 245-251. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/12/3/003 02681242 http://scholarbank.nus.edu.sg/handle/10635/81250 A1997WM02500001 Scopus |
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Singapore Singapore |
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| description |
10.1088/0268-1242/12/3/003 |
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ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ling, C.H. Ang, D.S. Ooi, J.A. |
| format |
Article |
| author |
Ling, C.H. Ang, D.S. Ooi, J.A. |
| spellingShingle |
Ling, C.H. Ang, D.S. Ooi, J.A. The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| author_sort |
Ling, C.H. |
| title |
The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| title_short |
The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| title_full |
The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| title_fullStr |
The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| title_full_unstemmed |
The effects of polysilicon dopant depletion and Fowler-Nordheim tunnelling on the characteristics of N+ polysilicon-oxide-silicon capacitors |
| title_sort |
effects of polysilicon dopant depletion and fowler-nordheim tunnelling on the characteristics of n+ polysilicon-oxide-silicon capacitors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81250 |
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1781783979313070080 |