Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement
IEEE International Conference on Conduction & Breakdown in Solid Dielectrics
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2014
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sg-nus-scholar.10635-813782015-01-08T23:28:51Z Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement Cha, C.L. Chor, E.F. Gong, H. Teo, T.H. Zhang, A.Q. Chan, L. ELECTRICAL ENGINEERING MATERIALS SCIENCE IEEE International Conference on Conduction & Breakdown in Solid Dielectrics 253-256 PICBF 2014-10-07T03:07:40Z 2014-10-07T03:07:40Z 1998 Conference Paper Cha, C.L.,Chor, E.F.,Gong, H.,Teo, T.H.,Zhang, A.Q.,Chan, L. (1998). Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement. IEEE International Conference on Conduction & Breakdown in Solid Dielectrics : 253-256. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81378 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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| description |
IEEE International Conference on Conduction & Breakdown in Solid Dielectrics |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Cha, C.L. Chor, E.F. Gong, H. Teo, T.H. Zhang, A.Q. Chan, L. |
| format |
Conference or Workshop Item |
| author |
Cha, C.L. Chor, E.F. Gong, H. Teo, T.H. Zhang, A.Q. Chan, L. |
| spellingShingle |
Cha, C.L. Chor, E.F. Gong, H. Teo, T.H. Zhang, A.Q. Chan, L. Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| author_sort |
Cha, C.L. |
| title |
Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| title_short |
Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| title_full |
Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| title_fullStr |
Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| title_full_unstemmed |
Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| title_sort |
application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurement |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81378 |
| _version_ |
1681089060346527744 |