Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices

Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices

International Symposium on IC Technology, Systems and Applications

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Main Authors: Cha, C.L., Chor, E.F., Gong, H., Zhang, A.Q., Chan, L., Xie, J.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81405
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-814052024-11-14T00:58:09Z Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Chan, L. Xie, J. ELECTRICAL ENGINEERING MATERIALS SCIENCE International Symposium on IC Technology, Systems and Applications 7 356-359 2014-10-07T03:07:58Z 2014-10-07T03:07:58Z 1997 Conference Paper Cha, C.L.,Chor, E.F.,Gong, H.,Zhang, A.Q.,Chan, L.,Xie, J. (1997). Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices. International Symposium on IC Technology, Systems and Applications 7 : 356-359. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81405 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description International Symposium on IC Technology, Systems and Applications
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Chan, L.
Xie, J.
format Conference or Workshop Item
author Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Chan, L.
Xie, J.
spellingShingle Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Chan, L.
Xie, J.
Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
author_sort Cha, C.L.
title Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
title_short Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
title_full Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
title_fullStr Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
title_full_unstemmed Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devices
title_sort effects of constant current-stressing on reoxidized nitrided oxide (ono) in flash memory devices
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81405
_version_ 1821203449914589184

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