Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current

Digest of Technical Papers - Symposium on VLSI Technology

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Bibliographic Details
Main Authors: Low, T., Hou, Y.T., Li, M.F., Zhu, C., Kwong, D.-L., Chin, A.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81442
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Institution: National University of Singapore