Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current
Digest of Technical Papers - Symposium on VLSI Technology
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2014
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sg-nus-scholar.10635-814422015-02-24T09:15:32Z Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current Low, T. Hou, Y.T. Li, M.F. Zhu, C. Kwong, D.-L. Chin, A. ELECTRICAL ENGINEERING ELECTRICAL & COMPUTER ENGINEERING Digest of Technical Papers - Symposium on VLSI Technology 117-118 DTPTE 2014-10-07T03:08:22Z 2014-10-07T03:08:22Z 2003 Conference Paper Low, T.,Hou, Y.T.,Li, M.F.,Zhu, C.,Kwong, D.-L.,Chin, A. (2003). Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current. Digest of Technical Papers - Symposium on VLSI Technology : 117-118. ScholarBank@NUS Repository. 07431562 http://scholarbank.nus.edu.sg/handle/10635/81442 NOT_IN_WOS Scopus |
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Digest of Technical Papers - Symposium on VLSI Technology |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Low, T. Hou, Y.T. Li, M.F. Zhu, C. Kwong, D.-L. Chin, A. |
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Low, T. Hou, Y.T. Li, M.F. Zhu, C. Kwong, D.-L. Chin, A. |
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Low, T. Hou, Y.T. Li, M.F. Zhu, C. Kwong, D.-L. Chin, A. Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
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Low, T. |
title |
Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
title_short |
Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
title_full |
Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
title_fullStr |
Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
title_full_unstemmed |
Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current |
title_sort |
germanium mos: an evaluation from carrier quantization and tunneling current |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/81442 |
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1681089072040247296 |