Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates

Materials Science in Semiconductor Processing

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Bibliographic Details
Main Authors:	Feng, Z.C., Yang, T.R., Hou, Y.T.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	GaN Infrared reflectance Non-destructive Sapphire Silicon
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81486
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81486
record_format	dspace
spelling	sg-nus-scholar.10635-814862023-08-10T08:32:28Z Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates Feng, Z.C. Yang, T.R. Hou, Y.T. ELECTRICAL ENGINEERING GaN Infrared reflectance Non-destructive Sapphire Silicon Materials Science in Semiconductor Processing 4 6 571-576 2014-10-07T03:08:49Z 2014-10-07T03:08:49Z 2001-12 Conference Paper Feng, Z.C., Yang, T.R., Hou, Y.T. (2001-12). Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates. Materials Science in Semiconductor Processing 4 (6) : 571-576. ScholarBank@NUS Repository. 13698001 http://scholarbank.nus.edu.sg/handle/10635/81486 000175066200020 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	GaN Infrared reflectance Non-destructive Sapphire Silicon
spellingShingle	GaN Infrared reflectance Non-destructive Sapphire Silicon Feng, Z.C. Yang, T.R. Hou, Y.T. Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
description	Materials Science in Semiconductor Processing
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Feng, Z.C. Yang, T.R. Hou, Y.T.
format	Conference or Workshop Item
author	Feng, Z.C. Yang, T.R. Hou, Y.T.
author_sort	Feng, Z.C.
title	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
title_short	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
title_full	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
title_fullStr	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
title_full_unstemmed	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
title_sort	infrared reflectance analysis of gan epitaxial layers grown on sapphire and silicon substrates
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81486
_version_	1776257950262755328

Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates

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