Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Main Authors:	Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81491
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81491
record_format	dspace
spelling	sg-nus-scholar.10635-814912015-01-12T07:31:04Z Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis Ng, T.H. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Lou, C.L. Leang, S.E. Tao, J.M. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 113-118 234 2014-10-07T03:08:52Z 2014-10-07T03:08:52Z 1999 Conference Paper Ng, T.H.,Chim, W.K.,Chan, D.S.H.,Phang, J.C.H.,Liu, Y.Y.,Lou, C.L.,Leang, S.E.,Tao, J.M. (1999). Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 113-118. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81491 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ng, T.H. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Lou, C.L. Leang, S.E. Tao, J.M.
format	Conference or Workshop Item
author	Ng, T.H. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Lou, C.L. Leang, S.E. Tao, J.M.
spellingShingle	Ng, T.H. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Lou, C.L. Leang, S.E. Tao, J.M. Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
author_sort	Ng, T.H.
title	Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_short	Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_full	Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_fullStr	Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_full_unstemmed	Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_sort	integrated (automated) photon emission microscope and mosfet characterization system for combined microscopic and macroscopic device analysis
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81491
_version_	1681089081085263872

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

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