Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides

Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA

Saved in:
Bibliographic Details
Main Authors: Teh, G.L., Chim, W.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81681
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-81681
record_format dspace
spelling sg-nus-scholar.10635-816812015-01-09T15:40:18Z Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides Teh, G.L. Chim, W.K. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 156-161 234 2014-10-07T03:10:53Z 2014-10-07T03:10:53Z 1997 Conference Paper Teh, G.L.,Chim, W.K. (1997). Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 156-161. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81681 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Teh, G.L.
Chim, W.K.
format Conference or Workshop Item
author Teh, G.L.
Chim, W.K.
spellingShingle Teh, G.L.
Chim, W.K.
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
author_sort Teh, G.L.
title Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
title_short Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
title_full Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
title_fullStr Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
title_full_unstemmed Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
title_sort pre-breakdown charge trapping in esd stressed thin mos gate oxides
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81681
_version_ 1681089115515256832