Roles of primary hot hole and FN electron fluences in gate oxide breakdown

Materials Research Society Symposium - Proceedings

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Main Authors:	Li, M.F., He, Y.D., Ma, S.G., Cho, B.J., Lo, K.F.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81720
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81720
record_format	dspace
spelling	sg-nus-scholar.10635-817202015-01-09T06:26:57Z Roles of primary hot hole and FN electron fluences in gate oxide breakdown Li, M.F. He, Y.D. Ma, S.G. Cho, B.J. Lo, K.F. ELECTRICAL ENGINEERING Materials Research Society Symposium - Proceedings 592 99-104 MRSPD 2014-10-07T03:11:18Z 2014-10-07T03:11:18Z 2000 Conference Paper Li, M.F.,He, Y.D.,Ma, S.G.,Cho, B.J.,Lo, K.F. (2000). Roles of primary hot hole and FN electron fluences in gate oxide breakdown. Materials Research Society Symposium - Proceedings 592 : 99-104. ScholarBank@NUS Repository. 02729172 http://scholarbank.nus.edu.sg/handle/10635/81720 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Materials Research Society Symposium - Proceedings
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Li, M.F. He, Y.D. Ma, S.G. Cho, B.J. Lo, K.F.
format	Conference or Workshop Item
author	Li, M.F. He, Y.D. Ma, S.G. Cho, B.J. Lo, K.F.
spellingShingle	Li, M.F. He, Y.D. Ma, S.G. Cho, B.J. Lo, K.F. Roles of primary hot hole and FN electron fluences in gate oxide breakdown
author_sort	Li, M.F.
title	Roles of primary hot hole and FN electron fluences in gate oxide breakdown
title_short	Roles of primary hot hole and FN electron fluences in gate oxide breakdown
title_full	Roles of primary hot hole and FN electron fluences in gate oxide breakdown
title_fullStr	Roles of primary hot hole and FN electron fluences in gate oxide breakdown
title_full_unstemmed	Roles of primary hot hole and FN electron fluences in gate oxide breakdown
title_sort	roles of primary hot hole and fn electron fluences in gate oxide breakdown
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81720
_version_	1681089122562736128

Roles of primary hot hole and FN electron fluences in gate oxide breakdown

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