Aluminum-doped gadolinium oxides as blocking layer for improved charge retention in charge-trap-type nonvolatile memory devices

10.1109/TED.2009.2030834

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書目詳細資料
Main Authors: Pu, J., Chan, D.S.H., Kim, S.-J., Cho, B.J.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
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在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/81946
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機構: National University of Singapore