Carrier transport in strained p-channel field-effect transistors with diamondlike carbon liner stressor

Carrier transport in strained p-channel field-effect transistors with diamondlike carbon liner stressor

10.1063/1.3340947

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Bibliographic Details
Main Authors: Cheng, R., Liu, B., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82030
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Institution: National University of Singapore
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