Carrier transport in strained p-channel field-effect transistors with diamondlike carbon liner stressor
10.1063/1.3340947
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Main Authors: | Cheng, R., Liu, B., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82030 |
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Institution: | National University of Singapore |
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