Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack

10.1016/j.mee.2007.04.084

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Bibliographic Details
Main Authors:	Samanta, P., Zhu, C., Chan, M.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Acceptor and donor-like interface traps Border traps Hafnium oxide High-k Proton transport
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82048
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82048
record_format	dspace
spelling	sg-nus-scholar.10635-820482023-10-25T22:18:30Z Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack Samanta, P. Zhu, C. Chan, M. ELECTRICAL & COMPUTER ENGINEERING Acceptor and donor-like interface traps Border traps Hafnium oxide High-k Proton transport 10.1016/j.mee.2007.04.084 Microelectronic Engineering 84 9-10 1964-1967 MIENE 2014-10-07T04:24:47Z 2014-10-07T04:24:47Z 2007-09 Article Samanta, P., Zhu, C., Chan, M. (2007-09). Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack. Microelectronic Engineering 84 (9-10) : 1964-1967. ScholarBank@NUS Repository. https://doi.org/10.1016/j.mee.2007.04.084 01679317 http://scholarbank.nus.edu.sg/handle/10635/82048 000247378600029 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Acceptor and donor-like interface traps Border traps Hafnium oxide High-k Proton transport
spellingShingle	Acceptor and donor-like interface traps Border traps Hafnium oxide High-k Proton transport Samanta, P. Zhu, C. Chan, M. Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
description	10.1016/j.mee.2007.04.084
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Samanta, P. Zhu, C. Chan, M.
format	Article
author	Samanta, P. Zhu, C. Chan, M.
author_sort	Samanta, P.
title	Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
title_short	Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
title_full	Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
title_fullStr	Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
title_full_unstemmed	Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack
title_sort	charge carrier generation/trapping mechanisms in hfo2/sio2 stack
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82048
_version_	1781784049176543232

Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack

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