Effectiveness of aluminum incorporation in nickel silicide and nickel germanide metal gates for work function reduction

10.1143/JJAP.47.2383

Saved in:
Bibliographic Details
Main Authors: Lim, A.E.-J., Lee, R.T.P., Koh, A.T.Y., Samudra, G.S., Kwong, D.-L., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Al
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82218
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore