Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation

10.1109/TED.2006.870273

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Main Authors: Tan, Y.N., Chim, W.K., Choi, W.K., Joo, M.S., Cho, B.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/82443
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spelling sg-nus-scholar.10635-824432023-10-26T21:25:13Z Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation Tan, Y.N. Chim, W.K. Choi, W.K. Joo, M.S. Cho, B.J. ELECTRICAL & COMPUTER ENGINEERING Flash memories Hafnium aluminum oxide Hafnium oxide High dielectric constant (high-k) Polysilicon-oxide-nitride-oxide-silicon (SONOS) 10.1109/TED.2006.870273 IEEE Transactions on Electron Devices 53 4 654-662 IETDA 2014-10-07T04:29:27Z 2014-10-07T04:29:27Z 2006-04 Article Tan, Y.N., Chim, W.K., Choi, W.K., Joo, M.S., Cho, B.J. (2006-04). Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation. IEEE Transactions on Electron Devices 53 (4) : 654-662. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2006.870273 00189383 http://scholarbank.nus.edu.sg/handle/10635/82443 000236473500010 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Flash memories
Hafnium aluminum oxide
Hafnium oxide
High dielectric constant (high-k)
Polysilicon-oxide-nitride-oxide-silicon (SONOS)
spellingShingle Flash memories
Hafnium aluminum oxide
Hafnium oxide
High dielectric constant (high-k)
Polysilicon-oxide-nitride-oxide-silicon (SONOS)
Tan, Y.N.
Chim, W.K.
Choi, W.K.
Joo, M.S.
Cho, B.J.
Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
description 10.1109/TED.2006.870273
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tan, Y.N.
Chim, W.K.
Choi, W.K.
Joo, M.S.
Cho, B.J.
format Article
author Tan, Y.N.
Chim, W.K.
Choi, W.K.
Joo, M.S.
Cho, B.J.
author_sort Tan, Y.N.
title Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
title_short Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
title_full Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
title_fullStr Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
title_full_unstemmed Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operation
title_sort hafnium aluminum oxide as charge storage and blocking-oxide layers in sonos-type nonvolatile memory for high-speed operation
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82443
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