Metal gate work function engineering on gate leakage of MOSFETs
10.1109/TED.2004.836544
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sg-nus-scholar.10635-826812023-10-26T21:23:38Z Metal gate work function engineering on gate leakage of MOSFETs Hou, Y.-T. Li, M.-F. Low, T. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING 10.1109/TED.2004.836544 IEEE Transactions on Electron Devices 51 11 1783-1789 IETDA 2014-10-07T04:32:15Z 2014-10-07T04:32:15Z 2004-11 Article Hou, Y.-T., Li, M.-F., Low, T., Kwong, D.-L. (2004-11). Metal gate work function engineering on gate leakage of MOSFETs. IEEE Transactions on Electron Devices 51 (11) : 1783-1789. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2004.836544 00189383 http://scholarbank.nus.edu.sg/handle/10635/82681 000224656800005 Scopus |
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10.1109/TED.2004.836544 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Hou, Y.-T. Li, M.-F. Low, T. Kwong, D.-L. |
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Hou, Y.-T. Li, M.-F. Low, T. Kwong, D.-L. |
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Hou, Y.-T. Li, M.-F. Low, T. Kwong, D.-L. Metal gate work function engineering on gate leakage of MOSFETs |
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Hou, Y.-T. |
title |
Metal gate work function engineering on gate leakage of MOSFETs |
title_short |
Metal gate work function engineering on gate leakage of MOSFETs |
title_full |
Metal gate work function engineering on gate leakage of MOSFETs |
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Metal gate work function engineering on gate leakage of MOSFETs |
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Metal gate work function engineering on gate leakage of MOSFETs |
title_sort |
metal gate work function engineering on gate leakage of mosfets |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/82681 |
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