Metal gate work function engineering on gate leakage of MOSFETs
10.1109/TED.2004.836544
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Main Authors: | Hou, Y.-T., Li, M.-F., Low, T., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82681 |
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Institution: | National University of Singapore |
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