Fermi pinning-induced thermal instability of metal-gate work functions

Fermi pinning-induced thermal instability of metal-gate work functions

10.1109/LED.2004.827643

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Bibliographic Details
Main Authors: Yu, H.Y., Ren, C., Yeo, Y.-C., Kang, J.F., Wang, X.P., Ma, H.H.H., Li, M.-F., Chan, D.S.H., Kwong, D.-L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Others
Published: 2014
Subjects:
Extrinsic states
Fermi pinning
Metal gate
Thermal stability
Work function
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84406
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/84406

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