Fermi pinning-induced thermal instability of metal-gate work functions

• Main Authors: Yu, H.Y., Ren, C., Yeo, Y.-C., Kang, J.F., Wang, X.P., Ma, H.H.H., Li, M.-F., Chan, D.S.H., Kwong, D.-L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Others
• Published: 2014
• Subjects: Extrinsic states; Fermi pinning; Metal gate; Thermal stability; Work function
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/84406
• Institution: National University of Singapore

10.1109/LED.2004.827643