Microstructural characterization of rf sputtered polycrystalline silicon germanium films

10.1063/1.1423388

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Main Authors: Choi, W.K., Teh, L.K., Bera, L.K., Chim, W.K., Wee, A.T.S., Jie, Y.X.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82700
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-827002023-10-30T08:01:40Z Microstructural characterization of rf sputtered polycrystalline silicon germanium films Choi, W.K. Teh, L.K. Bera, L.K. Chim, W.K. Wee, A.T.S. Jie, Y.X. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1423388 Journal of Applied Physics 91 1 444-450 JAPIA 2014-10-07T04:32:28Z 2014-10-07T04:32:28Z 2002-01-01 Article Choi, W.K., Teh, L.K., Bera, L.K., Chim, W.K., Wee, A.T.S., Jie, Y.X. (2002-01-01). Microstructural characterization of rf sputtered polycrystalline silicon germanium films. Journal of Applied Physics 91 (1) : 444-450. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1423388 00218979 http://scholarbank.nus.edu.sg/handle/10635/82700 000172835600070 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1423388
author2 PHYSICS
author_facet PHYSICS
Choi, W.K.
Teh, L.K.
Bera, L.K.
Chim, W.K.
Wee, A.T.S.
Jie, Y.X.
format Article
author Choi, W.K.
Teh, L.K.
Bera, L.K.
Chim, W.K.
Wee, A.T.S.
Jie, Y.X.
spellingShingle Choi, W.K.
Teh, L.K.
Bera, L.K.
Chim, W.K.
Wee, A.T.S.
Jie, Y.X.
Microstructural characterization of rf sputtered polycrystalline silicon germanium films
author_sort Choi, W.K.
title Microstructural characterization of rf sputtered polycrystalline silicon germanium films
title_short Microstructural characterization of rf sputtered polycrystalline silicon germanium films
title_full Microstructural characterization of rf sputtered polycrystalline silicon germanium films
title_fullStr Microstructural characterization of rf sputtered polycrystalline silicon germanium films
title_full_unstemmed Microstructural characterization of rf sputtered polycrystalline silicon germanium films
title_sort microstructural characterization of rf sputtered polycrystalline silicon germanium films
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82700
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