Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon

10.1088/0957-4484/15/5/043

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Bibliographic Details
Main Authors: Zeng, Y.P., Lu, Y.F., Shen, Z.X., Sun, W.X., Yu, T., Liu, L., Zeng, J.N., Cho, B.J., Poon, C.H.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82961
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-829612023-10-30T07:59:43Z Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon Zeng, Y.P. Lu, Y.F. Shen, Z.X. Sun, W.X. Yu, T. Liu, L. Zeng, J.N. Cho, B.J. Poon, C.H. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1088/0957-4484/15/5/043 Nanotechnology 15 5 658-662 NNOTE 2014-10-07T04:35:34Z 2014-10-07T04:35:34Z 2004-05 Article Zeng, Y.P., Lu, Y.F., Shen, Z.X., Sun, W.X., Yu, T., Liu, L., Zeng, J.N., Cho, B.J., Poon, C.H. (2004-05). Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon. Nanotechnology 15 (5) : 658-662. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-4484/15/5/043 09574484 http://scholarbank.nus.edu.sg/handle/10635/82961 000221679800044 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1088/0957-4484/15/5/043
author2 PHYSICS
author_facet PHYSICS
Zeng, Y.P.
Lu, Y.F.
Shen, Z.X.
Sun, W.X.
Yu, T.
Liu, L.
Zeng, J.N.
Cho, B.J.
Poon, C.H.
format Article
author Zeng, Y.P.
Lu, Y.F.
Shen, Z.X.
Sun, W.X.
Yu, T.
Liu, L.
Zeng, J.N.
Cho, B.J.
Poon, C.H.
spellingShingle Zeng, Y.P.
Lu, Y.F.
Shen, Z.X.
Sun, W.X.
Yu, T.
Liu, L.
Zeng, J.N.
Cho, B.J.
Poon, C.H.
Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
author_sort Zeng, Y.P.
title Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
title_short Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
title_full Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
title_fullStr Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
title_full_unstemmed Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
title_sort raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82961
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