Reliability of ultrathin (

10.1088/0268-1242/18/1/305

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Bibliographic Details
Main Authors: Samanta, S.K., Chatterjee, S., Choi, W.K., Bera, L.K., Banerjee, H.D., Maiti, C.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82976
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Institution: National University of Singapore