Reliability of ultrathin (

Reliability of ultrathin (

10.1088/0268-1242/18/1/305

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Bibliographic Details
Main Authors:	Samanta, S.K., Chatterjee, S., Choi, W.K., Bera, L.K., Banerjee, H.D., Maiti, C.K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82976
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

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