Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide

10.1063/1.1609638

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Bibliographic Details
Main Authors: Chim, W.K., Zheng, J.X., Koh, B.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56671
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Institution: National University of Singapore