Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide
10.1063/1.1609638
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sg-nus-scholar.10635-566712023-10-30T22:04:30Z Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide Chim, W.K. Zheng, J.X. Koh, B.H. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1609638 Journal of Applied Physics 94 8 5273-5277 JAPIA 2014-06-17T02:57:15Z 2014-06-17T02:57:15Z 2003-10-15 Article Chim, W.K., Zheng, J.X., Koh, B.H. (2003-10-15). Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide. Journal of Applied Physics 94 (8) : 5273-5277. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1609638 00218979 http://scholarbank.nus.edu.sg/handle/10635/56671 000185664300084 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Chim, W.K. Zheng, J.X. Koh, B.H. |
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Chim, W.K. Zheng, J.X. Koh, B.H. |
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Chim, W.K. Zheng, J.X. Koh, B.H. Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
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Chim, W.K. |
title |
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
title_short |
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
title_full |
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
title_fullStr |
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
title_full_unstemmed |
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
title_sort |
modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/56671 |
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1781781230729035776 |