Silicon-carbon source and drain stressors: Carbon profile design by ion implantation
10.1149/2.072204jes
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sg-nus-scholar.10635-830222023-10-30T07:10:23Z Silicon-carbon source and drain stressors: Carbon profile design by ion implantation Zhou, Q. Koh, S.-M. Tong, Y. Henry, T. Erokhin, Y. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1149/2.072204jes Journal of the Electrochemical Society 159 4 H425-H432 JESOA 2014-10-07T04:36:18Z 2014-10-07T04:36:18Z 2012 Article Zhou, Q., Koh, S.-M., Tong, Y., Henry, T., Erokhin, Y., Yeo, Y.-C. (2012). Silicon-carbon source and drain stressors: Carbon profile design by ion implantation. Journal of the Electrochemical Society 159 (4) : H425-H432. ScholarBank@NUS Repository. https://doi.org/10.1149/2.072204jes 00134651 http://scholarbank.nus.edu.sg/handle/10635/83022 000300488300095 Scopus |
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10.1149/2.072204jes |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Zhou, Q. Koh, S.-M. Tong, Y. Henry, T. Erokhin, Y. Yeo, Y.-C. |
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Article |
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Zhou, Q. Koh, S.-M. Tong, Y. Henry, T. Erokhin, Y. Yeo, Y.-C. |
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Zhou, Q. Koh, S.-M. Tong, Y. Henry, T. Erokhin, Y. Yeo, Y.-C. Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
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Zhou, Q. |
title |
Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
title_short |
Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
title_full |
Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
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Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
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Silicon-carbon source and drain stressors: Carbon profile design by ion implantation |
title_sort |
silicon-carbon source and drain stressors: carbon profile design by ion implantation |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/83022 |
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