Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation

10.1016/j.sse.2013.01.031

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Main Authors: Wang, L., Su, S., Wang, W., Gong, X., Yang, Y., Guo, P., Zhang, G., Xue, C., Cheng, B., Han, G., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/83077
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spelling sg-nus-scholar.10635-830772023-10-29T20:57:55Z Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation Wang, L. Su, S. Wang, W. Gong, X. Yang, Y. Guo, P. Zhang, G. Xue, C. Cheng, B. Han, G. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Germanium-tin High-mobility Metal-oxide-semiconductor field-effect Surface passivation Transistor (MOSFET) 10.1016/j.sse.2013.01.031 Solid-State Electronics 83 66-70 SSELA 2014-10-07T04:36:59Z 2014-10-07T04:36:59Z 2013 Article Wang, L., Su, S., Wang, W., Gong, X., Yang, Y., Guo, P., Zhang, G., Xue, C., Cheng, B., Han, G., Yeo, Y.-C. (2013). Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation. Solid-State Electronics 83 : 66-70. ScholarBank@NUS Repository. https://doi.org/10.1016/j.sse.2013.01.031 00381101 http://scholarbank.nus.edu.sg/handle/10635/83077 000318464500013 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Germanium-tin
High-mobility
Metal-oxide-semiconductor field-effect
Surface passivation
Transistor (MOSFET)
spellingShingle Germanium-tin
High-mobility
Metal-oxide-semiconductor field-effect
Surface passivation
Transistor (MOSFET)
Wang, L.
Su, S.
Wang, W.
Gong, X.
Yang, Y.
Guo, P.
Zhang, G.
Xue, C.
Cheng, B.
Han, G.
Yeo, Y.-C.
Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
description 10.1016/j.sse.2013.01.031
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Wang, L.
Su, S.
Wang, W.
Gong, X.
Yang, Y.
Guo, P.
Zhang, G.
Xue, C.
Cheng, B.
Han, G.
Yeo, Y.-C.
format Article
author Wang, L.
Su, S.
Wang, W.
Gong, X.
Yang, Y.
Guo, P.
Zhang, G.
Xue, C.
Cheng, B.
Han, G.
Yeo, Y.-C.
author_sort Wang, L.
title Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
title_short Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
title_full Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
title_fullStr Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
title_full_unstemmed Strained germanium-tin (GeSn) p-channel metal-oxide-semiconductor field-effect-transistors (p-MOSFETs) with ammonium sulfide passivation
title_sort strained germanium-tin (gesn) p-channel metal-oxide-semiconductor field-effect-transistors (p-mosfets) with ammonium sulfide passivation
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83077
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