Thermal instability of effective work function in metal/high-κ stack and its material dependence

Thermal instability of effective work function in metal/high-κ stack and its material dependence

IEEE Electron Device Letters

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Bibliographic Details
Main Authors: Joo, M.S., Cho, B.J., Balasubramanian, N., Kwong, D.-L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83190
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/83190

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