Thermal instability of effective work function in metal/high-κ stack and its material dependence

• Main Authors: Joo, M.S., Cho, B.J., Balasubramanian, N., Kwong, D.-L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83190
• Institution: National University of Singapore

IEEE Electron Device Letters