A novel program-erasable capacitor using high-κ AlN dielectric

• Main Authors: Lai, C.H., Ma, M.W., Cheng, C.F., Chin, A., McAlister, S.P., Zhu, C.X., Li, M.-F., Kwong, D.L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83403
• Institution: National University of Singapore

10.1109/DRC.2004.1367791