Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test

• Main Authors: Lou, L., Yan, H., He, C., Park, W.-T., Kwong, D.-L., Lee, C.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Conference or Workshop Item
• 出版: 2014
• 主題: Fatigue; large compressive strain; piezoresistive; pressure sensor; silicon nanowire
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/83544
• 機構: National University of Singapore

10.1109/IPFA.2012.6306318