Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain

Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain

10.1109/TED.2012.2214440

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Bibliographic Details
Main Authors: Lou, L., Yan, H., Park, W.-T., Kwong, D.-L., Lee, C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Fatigue
large compressive strain
piezoresistive
pressure sensor
silicon nanowire (SiNW)
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82045
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/82045

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