Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain

10.1109/TED.2012.2214440

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Bibliographic Details
Main Authors:	Lou, L., Yan, H., Park, W.-T., Kwong, D.-L., Lee, C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Fatigue large compressive strain piezoresistive pressure sensor silicon nanowire (SiNW)
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82045
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82045
record_format	dspace
spelling	sg-nus-scholar.10635-820452024-11-09T08:00:41Z Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain Lou, L. Yan, H. Park, W.-T. Kwong, D.-L. Lee, C. ELECTRICAL & COMPUTER ENGINEERING Fatigue large compressive strain piezoresistive pressure sensor silicon nanowire (SiNW) 10.1109/TED.2012.2214440 IEEE Transactions on Electron Devices 59 11 3097-3103 IETDA 2014-10-07T04:24:45Z 2014-10-07T04:24:45Z 2012 Article Lou, L., Yan, H., Park, W.-T., Kwong, D.-L., Lee, C. (2012). Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain. IEEE Transactions on Electron Devices 59 (11) : 3097-3103. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2012.2214440 00189383 http://scholarbank.nus.edu.sg/handle/10635/82045 000310385100034 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Fatigue large compressive strain piezoresistive pressure sensor silicon nanowire (SiNW)
spellingShingle	Fatigue large compressive strain piezoresistive pressure sensor silicon nanowire (SiNW) Lou, L. Yan, H. Park, W.-T. Kwong, D.-L. Lee, C. Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
description	10.1109/TED.2012.2214440
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Lou, L. Yan, H. Park, W.-T. Kwong, D.-L. Lee, C.
format	Article
author	Lou, L. Yan, H. Park, W.-T. Kwong, D.-L. Lee, C.
author_sort	Lou, L.
title	Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
title_short	Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
title_full	Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
title_fullStr	Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
title_full_unstemmed	Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
title_sort	characterization of piezoresistive-si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82045
_version_	1821216431148105728

Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain

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