Characterization of piezoresistive-Si-nanowire-based pressure sensors by dynamic cycling test with extralarge compressive strain
10.1109/TED.2012.2214440
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Main Authors: | Lou, L., Yan, H., Park, W.-T., Kwong, D.-L., Lee, C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82045 |
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Institution: | National University of Singapore |
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