Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test

Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test

10.1109/IPFA.2012.6306318

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Bibliographic Details
Main Authors: Lou, L., Yan, H., He, C., Park, W.-T., Kwong, D.-L., Lee, C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Fatigue
large compressive strain
piezoresistive
pressure sensor
silicon nanowire
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83544
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-835442015-01-14T06:48:11Z Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test Lou, L. Yan, H. He, C. Park, W.-T. Kwong, D.-L. Lee, C. ELECTRICAL & COMPUTER ENGINEERING Fatigue large compressive strain piezoresistive pressure sensor silicon nanowire 10.1109/IPFA.2012.6306318 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA - 2014-10-07T04:42:25Z 2014-10-07T04:42:25Z 2012 Conference Paper Lou, L.,Yan, H.,He, C.,Park, W.-T.,Kwong, D.-L.,Lee, C. (2012). Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2012.6306318" target="_blank">https://doi.org/10.1109/IPFA.2012.6306318</a> 9781467309806 http://scholarbank.nus.edu.sg/handle/10635/83544 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Fatigue
large compressive strain
piezoresistive
pressure sensor
silicon nanowire
spellingShingle Fatigue
large compressive strain
piezoresistive
pressure sensor
silicon nanowire
Lou, L.
Yan, H.
He, C.
Park, W.-T.
Kwong, D.-L.
Lee, C.
Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
description 10.1109/IPFA.2012.6306318
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Lou, L.
Yan, H.
He, C.
Park, W.-T.
Kwong, D.-L.
Lee, C.
format Conference or Workshop Item
author Lou, L.
Yan, H.
He, C.
Park, W.-T.
Kwong, D.-L.
Lee, C.
author_sort Lou, L.
title Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
title_short Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
title_full Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
title_fullStr Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
title_full_unstemmed Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
title_sort characterization of si nanowires-based piezoresistive pressure sensor by dynamic cycling test
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83544
_version_ 1681089455457304576

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