C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys

C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys

International Journal of Modern Physics B

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Bibliographic Details
Main Authors: Feng, W., Choi, W.K., Bera, L.K., Mi, J., Yang, C.Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83600
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Institution: National University of Singapore
Description
Summary:International Journal of Modern Physics B

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