C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys

International Journal of Modern Physics B

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Main Authors:	Feng, W., Choi, W.K., Bera, L.K., Mi, J., Yang, C.Y.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83600
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-83600
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spelling	sg-nus-scholar.10635-836002015-01-11T21:30:40Z C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys Feng, W. Choi, W.K. Bera, L.K. Mi, J. Yang, C.Y. ELECTRICAL & COMPUTER ENGINEERING International Journal of Modern Physics B 16 28-29 4207-4210 IJPBE 2014-10-07T04:43:02Z 2014-10-07T04:43:02Z 2002-11-20 Conference Paper Feng, W.,Choi, W.K.,Bera, L.K.,Mi, J.,Yang, C.Y. (2002-11-20). C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys. International Journal of Modern Physics B 16 (28-29) : 4207-4210. ScholarBank@NUS Repository. 02179792 http://scholarbank.nus.edu.sg/handle/10635/83600 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	International Journal of Modern Physics B
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Feng, W. Choi, W.K. Bera, L.K. Mi, J. Yang, C.Y.
format	Conference or Workshop Item
author	Feng, W. Choi, W.K. Bera, L.K. Mi, J. Yang, C.Y.
spellingShingle	Feng, W. Choi, W.K. Bera, L.K. Mi, J. Yang, C.Y. C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
author_sort	Feng, W.
title	C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
title_short	C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
title_full	C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
title_fullStr	C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
title_full_unstemmed	C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
title_sort	c-v and dlts characterization of rapid thermal oxides on si0.887ge0.113 and si0.8811ge0.113c0.0059 alloys
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83600
_version_	1681089465776340992

C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys

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