C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys
International Journal of Modern Physics B
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Main Authors: | Feng, W., Choi, W.K., Bera, L.K., Mi, J., Yang, C.Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83600 |
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Institution: | National University of Singapore |
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