Achieving sub-0.1 ev hole schottky barrier height for NiSiGe on SiGe by aluminum segregation

10.1149/1.3072677

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Bibliographic Details
Main Authors: Sinha, M., Lee, R.T.P., Lohani, A., Mhaisalkar, S., Chor, E.F., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54875
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Institution: National University of Singapore