DLTS characterisation of InGaAlP films grown using different V/III ratios

• Main Authors: Lim, H.F., Chi, D.Z., Dong, J.R., Soh, C.B., Chua, S.J.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Conference or Workshop Item
• 出版: 2014
• 主題: DLTS; Extended defects; InGaAlP; Logarithmic capture
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/83644

10.1016/S1369-8001(02)00031-8