Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors

10.1109/TMAG.2007.893118

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Main Authors: Jiang, J., Bae, S., Kim, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/83677
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spelling sg-nus-scholar.10635-836772023-10-26T09:27:42Z Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors Jiang, J. Bae, S. Kim, S. ELECTRICAL & COMPUTER ENGINEERING Cu spacer microstructure Electromigration FM/Cu spacer interface FM/Cu/FM tri-layers Interdiffusion of Cu spacer 10.1109/TMAG.2007.893118 IEEE Transactions on Magnetics 43 6 2836-2838 IEMGA 2014-10-07T04:43:55Z 2014-10-07T04:43:55Z 2007-06 Conference Paper Jiang, J., Bae, S., Kim, S. (2007-06). Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors. IEEE Transactions on Magnetics 43 (6) : 2836-2838. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2007.893118 00189464 http://scholarbank.nus.edu.sg/handle/10635/83677 000246706200248 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Cu spacer microstructure
Electromigration
FM/Cu spacer interface
FM/Cu/FM tri-layers
Interdiffusion of Cu spacer
spellingShingle Cu spacer microstructure
Electromigration
FM/Cu spacer interface
FM/Cu/FM tri-layers
Interdiffusion of Cu spacer
Jiang, J.
Bae, S.
Kim, S.
Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
description 10.1109/TMAG.2007.893118
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Jiang, J.
Bae, S.
Kim, S.
format Conference or Workshop Item
author Jiang, J.
Bae, S.
Kim, S.
author_sort Jiang, J.
title Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
title_short Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
title_full Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
title_fullStr Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
title_full_unstemmed Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors
title_sort effects of cu interdiffusion on the electromigration failure of fm/cu/fm tri-layers for spin valve read sensors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83677
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