Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices

10.1109/WiPDA.2013.6695581

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Main Authors: Samudra, G.S., Liang, Y.C., Li, Y., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83970
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-839702024-11-11T08:20:07Z Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices Samudra, G.S. Liang, Y.C. Li, Y. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/WiPDA.2013.6695581 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2013 - Proceedings 139-142 2014-10-07T04:47:17Z 2014-10-07T04:47:17Z 2013 Conference Paper Samudra, G.S.,Liang, Y.C.,Li, Y.,Yeo, Y.-C. (2013). Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices. 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2013 - Proceedings : 139-142. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/WiPDA.2013.6695581" target="_blank">https://doi.org/10.1109/WiPDA.2013.6695581</a> 9781479911943 http://scholarbank.nus.edu.sg/handle/10635/83970 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/WiPDA.2013.6695581
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Samudra, G.S.
Liang, Y.C.
Li, Y.
Yeo, Y.-C.
format Conference or Workshop Item
author Samudra, G.S.
Liang, Y.C.
Li, Y.
Yeo, Y.-C.
spellingShingle Samudra, G.S.
Liang, Y.C.
Li, Y.
Yeo, Y.-C.
Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
author_sort Samudra, G.S.
title Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
title_short Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
title_full Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
title_fullStr Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
title_full_unstemmed Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices
title_sort modelling of temperature dependence on current collapse phenomenon in algan/gan hemt devices
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83970
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