Reliably counting atomic planes of few-layer graphene (n > 4)

10.1021/nn102658a

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Bibliographic Details
Main Authors:	Koh, Y.K., Bae, M.-H., Cahill, D.G., Pop, E.
Other Authors:	MECHANICAL ENGINEERING
Format:	Article
Published:	2014
Subjects:	Absorbance of monolayer graphene Electrostatic interlayer screening Few-layer graphene Field-effect mobility of carriers Graphene thickness Number of graphene layers Raman spectroscopy
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/85600
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-85600
record_format	dspace
spelling	sg-nus-scholar.10635-856002023-10-30T08:37:23Z Reliably counting atomic planes of few-layer graphene (n > 4) Koh, Y.K. Bae, M.-H. Cahill, D.G. Pop, E. MECHANICAL ENGINEERING Absorbance of monolayer graphene Electrostatic interlayer screening Few-layer graphene Field-effect mobility of carriers Graphene thickness Number of graphene layers Raman spectroscopy 10.1021/nn102658a ACS Nano 5 1 269-274 2014-10-07T09:09:55Z 2014-10-07T09:09:55Z 2011-01-25 Article Koh, Y.K., Bae, M.-H., Cahill, D.G., Pop, E. (2011-01-25). Reliably counting atomic planes of few-layer graphene (n > 4). ACS Nano 5 (1) : 269-274. ScholarBank@NUS Repository. https://doi.org/10.1021/nn102658a 19360851 http://scholarbank.nus.edu.sg/handle/10635/85600 000286487300034 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Absorbance of monolayer graphene Electrostatic interlayer screening Few-layer graphene Field-effect mobility of carriers Graphene thickness Number of graphene layers Raman spectroscopy
spellingShingle	Absorbance of monolayer graphene Electrostatic interlayer screening Few-layer graphene Field-effect mobility of carriers Graphene thickness Number of graphene layers Raman spectroscopy Koh, Y.K. Bae, M.-H. Cahill, D.G. Pop, E. Reliably counting atomic planes of few-layer graphene (n > 4)
description	10.1021/nn102658a
author2	MECHANICAL ENGINEERING
author_facet	MECHANICAL ENGINEERING Koh, Y.K. Bae, M.-H. Cahill, D.G. Pop, E.
format	Article
author	Koh, Y.K. Bae, M.-H. Cahill, D.G. Pop, E.
author_sort	Koh, Y.K.
title	Reliably counting atomic planes of few-layer graphene (n > 4)
title_short	Reliably counting atomic planes of few-layer graphene (n > 4)
title_full	Reliably counting atomic planes of few-layer graphene (n > 4)
title_fullStr	Reliably counting atomic planes of few-layer graphene (n > 4)
title_full_unstemmed	Reliably counting atomic planes of few-layer graphene (n > 4)
title_sort	reliably counting atomic planes of few-layer graphene (n > 4)
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/85600
_version_	1781784712192196608

Reliably counting atomic planes of few-layer graphene (n > 4)

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