High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates
10.1016/j.electacta.2009.01.045
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2014
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sg-nus-scholar.10635-863992024-11-14T18:39:15Z High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates Wijesinghe, T.L.S.L. Li, S.Q. Breese, M.B.H. Blackwood, D.J. PHYSICS MATERIALS SCIENCE AND ENGINEERING Etching Lattice parameters Porous silicon Transmission electron microscopy Triple-axis X-ray diffraction 10.1016/j.electacta.2009.01.045 Electrochimica Acta 54 13 3671-3676 ELCAA 2014-10-07T09:50:15Z 2014-10-07T09:50:15Z 2009-05-01 Article Wijesinghe, T.L.S.L., Li, S.Q., Breese, M.B.H., Blackwood, D.J. (2009-05-01). High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates. Electrochimica Acta 54 (13) : 3671-3676. ScholarBank@NUS Repository. https://doi.org/10.1016/j.electacta.2009.01.045 00134686 http://scholarbank.nus.edu.sg/handle/10635/86399 000265701100027 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
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Etching Lattice parameters Porous silicon Transmission electron microscopy Triple-axis X-ray diffraction |
| spellingShingle |
Etching Lattice parameters Porous silicon Transmission electron microscopy Triple-axis X-ray diffraction Wijesinghe, T.L.S.L. Li, S.Q. Breese, M.B.H. Blackwood, D.J. High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| description |
10.1016/j.electacta.2009.01.045 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Wijesinghe, T.L.S.L. Li, S.Q. Breese, M.B.H. Blackwood, D.J. |
| format |
Article |
| author |
Wijesinghe, T.L.S.L. Li, S.Q. Breese, M.B.H. Blackwood, D.J. |
| author_sort |
Wijesinghe, T.L.S.L. |
| title |
High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| title_short |
High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| title_full |
High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| title_fullStr |
High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| title_full_unstemmed |
High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates |
| title_sort |
high resolution tem and triple-axis xrd investigation into porous silicon formed on highly conducting substrates |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86399 |
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1821213831718764544 |